发明名称 |
VISUAL INSPECTION METHOD AND VISUAL INSPECTION DEVICE FOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a visual inspection method and a visual inspection device therefor improving substrate manufacturing yield by enabling determination of the flaws and pits on the surface of a substrate and accurate quality determination of the substrate. SOLUTION: This visual inspection method for the substrate includes the following processes (1) to (3): (1) A process for obtaining linear polarized light by passing light from a light source L through a first polarizing plate 3A having a light absorbing axis in one direction. (2) A process for emitting the linear polarized light to one side of an inspection subject substrate 1. (3) A process for arranging a second polarizing plate 3B having a light absorbing axis to absorb the linear polarized light having passed through the inspection subject substrate 1 on the other side of the inspection subject substrate 1 and for determining the flaws and pits on the surface of the substrate by contrast displayed on the second polarizing plate 3B. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2007263928(A) |
申请公布日期 |
2007.10.11 |
申请号 |
JP20060093307 |
申请日期 |
2006.03.30 |
申请人 |
EPSON IMAGING DEVICES CORP |
发明人 |
FUJIE TOSHIHIRO;ENDO MASAKI |
分类号 |
G01M11/00;G01B11/30;G01N21/88 |
主分类号 |
G01M11/00 |
代理机构 |
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