发明名称 POSITIVE PHOTOSENSITIVE COMPOSITION, AND RESIST PATTERN FORMING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To solve the problems of a performance-improving the technique for microfabrication of a semiconductor element or the like that uses ultraviolet radiation, excimer laser light, an electron beam or the like, and to provide a positive photosensitive composition, having high sensitivity and high resolution and satisfying a good pattern profile. <P>SOLUTION: The positive photosensitive composition comprises an acid generator which generates acid upon irradiation with a high energy line and a matrix component which has an oxanorbornadiene skeleton, particularly an oxabenzonorbornadiene skeleton within a molecule and is isomerized by the acid generated from the acid generator. At polarity change of a resist material, isomerization reaction of oxanorbornadienes into phenols, particularly, isomerization reaction of oxabenzonorbornadienes into naphthols is utilized, rather than a deprotection reaction. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007264040(A) 申请公布日期 2007.10.11
申请号 JP20060085291 申请日期 2006.03.27
申请人 WAKAYAMA PREFECTURE 发明人 MORI HAJIME;NOMURA EISAKU;HOSODA ASAO;MIYAKE YASUHITO;TANIGUCHI HISAJI;ITO OSAMU
分类号 G03F7/004;C07D493/08;C07D519/00;G03F7/039;H01L21/027 主分类号 G03F7/004
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