发明名称 Substrate treating method and production method for semiconductor device
摘要 A method for hydrogen sintering a substrate including a semiconductor device formed thereon comprises the steps of exciting a processing gas comprising a noble gas and a hydrogen gas to form a plasma comprising hydrogen radicals and hydrogen ions, and exposing the substrate to the plasma. A preferred method comprises forming a gate insulation film on a substrate, forming a polysilicon electrode on the gate insulation film, and exposing the polysilicon electrode to an atmosphere comprising hydrogen radicals and hydrogen ions.
申请公布号 US2007235421(A1) 申请公布日期 2007.10.11
申请号 US20070790463 申请日期 2007.04.25
申请人 TOKYO ELECTRON LIMITED 发明人 SUGAWARA TAKUYA;MATSUYAMA SEIJI;SASAKI MASARU
分类号 B23K9/00;H01L21/28;H01L21/30;H01L21/8242;H01L29/51 主分类号 B23K9/00
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