发明名称 DEVICE FOR PROTECTING CONTACTS OF INTEGRATION CIRCUITS WITH METAL-DIELECTRIC-SEMICONDUCTOR STRUCTURE FROM ELECTROSTATIC DISCHARGES
摘要 FIELD: semiconductor industry, in particular, integration microchips, possible use mainly for protecting inputs and outputs of high frequency metal-oxide semiconductor microchips from electrostatic discharges. ^ SUBSTANCE: the device contains key (p-channel) transistor (1) and key (n-channel) transistor (2), which provide passage of discharge current of large value, controlling symmetric (p-channel) transistor (3) and controlling symmetric (n-channel) transistor (4), which in turn ensure division of current on two equal (identical) components, and also load resistors (5) and (6). Sources of transistors (1) and (2) are connected to each other and to input bus (7) (being the common bus), and their drains are connected to power bus (8) and ground bus (9) respectively. Gate of transistor (1) and drain of transistor (4) through resistor (5) are connected to bus (8), and gate of transistor (2) and source of transistor (3) through resistor (6) are connected to bus (9). Gate of transistor (4) is connected to bus (9) and its drain - to input bus (6), and gate of transistor (3) is connected to bus (8) and its drain - to input bus (7). On appearance of electrostatic charge on input bus (7), passage of discharge current is ensured along transistors (1) and (2) simultaneously, resulting in twice lesser resistance discharge current circuit and making it possible to use less powerful key transistors in protection device. ^ EFFECT: increased efficiency. ^ 2 dwg
申请公布号 RU2308146(C2) 申请公布日期 2007.10.10
申请号 RU20050138593 申请日期 2005.12.13
申请人 OBSHCHESTVO S OGRANICHENNOJ OTVETSTVENNOST'JU "JUNIK AJ SIZ" 发明人 GORSHKOVA NATAL'JA MIKHAJLOVNA;GUBIN JAROSLAV SERGEEVICH;SIBAGATULLIN ARTUR GINIJATOVICH
分类号 H03K17/08 主分类号 H03K17/08
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