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发明名称
DELAY FAULT TEST CIRCUITRY AND RELATED METHOD
摘要
申请公布号
EP1702218(B1)
申请公布日期
2007.10.10
申请号
EP20040820969
申请日期
2004.12.17
申请人
NXP B.V.
发明人
MITTAL, AVIRAL
分类号
G01R31/3183;G01R31/30
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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