发明名称 Lithographic apparatus and device manufacturing method
摘要 <p>A lithographic apparatus is disclosed that is arranged to project a pattern from a patterning device onto a substrate, the lithographic apparatus has a substrate table (WT) configured to hold a substrate (W), the substrate table comprising a conditioning system (100) configured to hold a conditioning fluid and to condition the substrate table, wherein the conditioning system comprises a pressure damper (104,105) in fluid communication with the conditioning system and arranged to dampen a pressure variation in the conditioning system.</p>
申请公布号 EP1843206(A2) 申请公布日期 2007.10.10
申请号 EP20070251323 申请日期 2007.03.28
申请人 ASML NETHERLANDS B.V. 发明人 WIJCKMANS, MAURICE;CUIJPERS, MARTINUS AGNES WILLEM;DE JONG, FREDERIK EDUARD;VAN GOMPEL, EDWIN AUGUSTINUS MATHEUS;JANSEN, ROB;KUSTERS, GERARDUS ADRIANUS ANTONIUS MARIA;CADEE, THEODORUS, PETRUS MARIA;SMEETS, MARTIN FRANS PIERRE;VAN DER MEULEN, FRITS;SIMONS, WILHELMUS FRANCISCUS JOHANNES;LEENDERS, MARTINUS HENDRIKUS ANTONIUS;OTTENS, JOOST JEROEN;VAN BAREN, MARTIJN
分类号 G03F7/20;F16L55/04 主分类号 G03F7/20
代理机构 代理人
主权项
地址