发明名称 Methods and apparatus for determining the state of a variable resistive layer in a material stack
摘要 A method and an apparatus for detecting a number of variation in resistance within a material stack in response to a scanning and injection of a non-contacting electron stream into a material stack, the material stack having a first conductive contact layer, a variable resistive layer, a fixed resistive layer, and a second conductive contact layer, and the variations in resistance within the material stack being based on one of a plurality of resistive states of the variable resistive layer. The method also includes generating two magnetic fields within a transformer, the transformer being operatively coupled to the first and second conductive contact layers and generating a differential output signal within the transformer based on the two magnetic fields, the differential output signal being associated with one of the plurality of resistive states.
申请公布号 US7280456(B2) 申请公布日期 2007.10.09
申请号 US20030628526 申请日期 2003.07.28
申请人 INTEL CORPORATION 发明人 BROWN MICHAEL A.;JOHNSON LUKE A.
分类号 G11B7/00;G11B9/04 主分类号 G11B7/00
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