发明名称 Method of manufacturing semiconductor device and semiconductor device
摘要 A silicon substrate has a protective film formed on each side. A semiconductor surface opening not smaller than a given region is formed by removing the protective film. A through-hole having an inner size smaller than the given region is formed in the opening by laser machining. Thereafter, the inner size of the through-hole is increased by anisotropic etching, and the etching is ended when the inner size of the through-hole reaches the given size. In this way, a through-hole of a given size can be formed without allowing reversely tapered crystal planes to appear from a surface of the substrate toward the inside of the through-hole.
申请公布号 US7279776(B2) 申请公布日期 2007.10.09
申请号 US20050134427 申请日期 2005.05.23
申请人 CANON KABUSHIKI KAISHA 发明人 MORIMOTO HIROYUKI
分类号 H01L23/48;B23K26/00;H01L21/00;H01L21/20;H01L21/768;H01L23/52;H01L29/40;H05K3/02 主分类号 H01L23/48
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