| 摘要 |
Provided is a dual arcuate blade probe tip for probing a node, such as a node hole, on a circuit. The probe has a shaft made from an electrically conductive material, concentric to a longitudinal probe axis, and two separate arcuate edges coupled to the shaft and positioned transverse to the probe axis. The arcuate edges define a self-cleaning space therebetween, avoiding blockage of the probe by debris. The arcuate edges provide two single points of contact to concentrate applied force from the shaft to the node hole. The shaft may also include a plunger and/or a structure to prevent rotation of the probe about the probe axis.
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