发明名称 Method and device for short circuit or open load detection
摘要 A method or apparatus is provided for detecting an error condition associated with a load (R<SUB>L</SUB>) or a connection (P) to the load (R<SUB>L</SUB>). The load (R<SUB>L</SUB>) may comprise an energy storing element (Cext). During a first diagnosis phase, it is determined whether the load (R<SUB>L</SUB>) or the connection (P) to the load (R<SUB>L</SUB>) is in a normal operation condition or in an error condition. If the load (R<SUB>L</SUB>) or the connection (P) to the load (R<SUB>L</SUB>) is in an error condition, during a second diagnosis phase it is determined whether the error condition is an open load condition, short circuit condition to ground or a short circuit condition to a power supply. When the load is in a starting state before the first diagnosis phase, the method or apparatus may further comprise carrying out, after the second diagnosis phase, a resetting phase for resetting the load to the starting state.
申请公布号 US7280333(B2) 申请公布日期 2007.10.09
申请号 US20040810303 申请日期 2004.03.26
申请人 AMI SEMICONDUCTOR BELGIUM BVBA 发明人 HORSKY PAVEL;KOUDAR IVAN
分类号 H02H3/00;H02H3/087;H02H3/12 主分类号 H02H3/00
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