发明名称 Ion implantation apparatus and method for implanting ions by using the same
摘要 Disclosed are an ion implantation apparatus and a method for implanting ions by using the same. The ion implanter for implanting ions into a wafer, includes: a first quadrupole magnet assembly for focusing an ion beam transmitted from an ion beam source; a scanner for deflecting the transmitted ion beam in the directions of an X-axis and an Y-axis; a second quadrupole magnet assembly for converging and diverging the ion beam passing through the scanner in the directions of the X- and Y-axes; and a beam parallelizer for rotating the ion beam in synchronization with the second quadrupole magnet assembly, thereby implanting the ion beam into the wafer.
申请公布号 US7279691(B2) 申请公布日期 2007.10.09
申请号 US20040028003 申请日期 2004.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 ROUH KYOUNG-BONG;JIN SEUNG-WOO;LEE MIN-YONG
分类号 H01J37/317;H01J37/147;H01L21/265 主分类号 H01J37/317
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