发明名称 |
METHOD FOR TRANSFERRING TEST TRAY OF HANDLER |
摘要 |
<p>A method of transferring a test tray of a handler is provided to increase remarkably the number of tested electronic parts for a predetermined time by performing predetermined tests on the electronic parts while moving simultaneously two test trays. Test trays(T) with electronic parts are arranged at right and left sides of a waiting region, wherein the waiting region is prepared at the front of chambers. The test trays are vertically erected and supplied to left and right heating/cooling chambers(151a,151b) one by one. Each test tray is transferred to a rear portion in the left and right heating/cooling chambers. The test trays are vertically supplied in a test chamber(152) in order to perform simultaneously predetermined tests on the test trays corresponding to four test boards. When the electronic parts of the test trays are completed with the predetermined tests, the test trays are supplied to left and right heating/cooling control chambers(154a,154b). The test trays are transferred to front portions in the left and right heating/cooling control chambers. The test trays are horizontally transferred to the waiting position.</p> |
申请公布号 |
KR100765461(B1) |
申请公布日期 |
2007.10.09 |
申请号 |
KR20060115699 |
申请日期 |
2006.11.22 |
申请人 |
MIRAE CORPORATION |
发明人 |
YUN, HYO CHUL;BEOM, HEE RAK;SONG, JAE MYEONG;PARK, YONG GEUN;YUN, DAE GON |
分类号 |
H01L21/677 |
主分类号 |
H01L21/677 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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