发明名称 |
Transistor structure with a curved channel, memory cell and memory cell array for DRAMs, and methods for fabricating a DRAM |
摘要 |
A transistor structure having source/drain regions arranged in a horizontal plane along an x axis has a recess structure, which separates the two source/drain regions from one another and increases the effective channel length L<SUB>eff </SUB>of the transistor structure. A vertical gate electrode with respect to the horizontal plane extends along the x axis and in this case encloses an active zone of the transistor structure from two sides or completely. The effective channel width W<SUB>eff </SUB>is dependent on the depth to which the gate electrode is formed. A memory cell having a selection transistor in accordance with the transistor structure has both a low leakage current and a good switching behavior. By a suitable integration concept, the transistor structure is integrated into a memory cell array of a DRAM having hole trench capacitors or stacked capacitors.
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申请公布号 |
US7279742(B2) |
申请公布日期 |
2007.10.09 |
申请号 |
US20040024935 |
申请日期 |
2004.12.30 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
GRUENING-VON SCHWERIN ULRIKE |
分类号 |
H01L27/108;H01L21/8242;H01L29/76;H01L29/78;H01L29/94 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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