发明名称 Transistor structure with a curved channel, memory cell and memory cell array for DRAMs, and methods for fabricating a DRAM
摘要 A transistor structure having source/drain regions arranged in a horizontal plane along an x axis has a recess structure, which separates the two source/drain regions from one another and increases the effective channel length L<SUB>eff </SUB>of the transistor structure. A vertical gate electrode with respect to the horizontal plane extends along the x axis and in this case encloses an active zone of the transistor structure from two sides or completely. The effective channel width W<SUB>eff </SUB>is dependent on the depth to which the gate electrode is formed. A memory cell having a selection transistor in accordance with the transistor structure has both a low leakage current and a good switching behavior. By a suitable integration concept, the transistor structure is integrated into a memory cell array of a DRAM having hole trench capacitors or stacked capacitors.
申请公布号 US7279742(B2) 申请公布日期 2007.10.09
申请号 US20040024935 申请日期 2004.12.30
申请人 INFINEON TECHNOLOGIES AG 发明人 GRUENING-VON SCHWERIN ULRIKE
分类号 H01L27/108;H01L21/8242;H01L29/76;H01L29/78;H01L29/94 主分类号 H01L27/108
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