发明名称 |
INTERCONNECTION AND METHOD FOR FORMING THE SAME |
摘要 |
<p>A metal interconnection and its forming method are provided to reduce the resistance of a metal interconnection by forming contact plugs in various shapes. A first metal interconnection(125) is formed on a substrate(110), and a first barrier metal layer(120) is formed on a sidewall and bottom surface of the first metal interconnection. A first insulating layer(135) is formed to cover the first metal interconnection, and a second metal interconnection(175) is formed on the first insulating layer. A contact plug(171) penetrates the first insulating layer to connect the first and second metal interconnections. A second barrier metal layer(170) is formed on a sidewall and bottom of the contact plug and a sidewall and bottom of the second metal interconnection.</p> |
申请公布号 |
KR100764054(B1) |
申请公布日期 |
2007.10.08 |
申请号 |
KR20060079538 |
申请日期 |
2006.08.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, JEONG HOON;SHIN, HEON JONG |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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