发明名称 INTERCONNECTION AND METHOD FOR FORMING THE SAME
摘要 <p>A metal interconnection and its forming method are provided to reduce the resistance of a metal interconnection by forming contact plugs in various shapes. A first metal interconnection(125) is formed on a substrate(110), and a first barrier metal layer(120) is formed on a sidewall and bottom surface of the first metal interconnection. A first insulating layer(135) is formed to cover the first metal interconnection, and a second metal interconnection(175) is formed on the first insulating layer. A contact plug(171) penetrates the first insulating layer to connect the first and second metal interconnections. A second barrier metal layer(170) is formed on a sidewall and bottom of the contact plug and a sidewall and bottom of the second metal interconnection.</p>
申请公布号 KR100764054(B1) 申请公布日期 2007.10.08
申请号 KR20060079538 申请日期 2006.08.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, JEONG HOON;SHIN, HEON JONG
分类号 H01L21/28 主分类号 H01L21/28
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