发明名称 SURFACE INSPECTION SYSTEM
摘要 A surface inspection device is provided to decrease a defective rate of finished products and to increase productivity thereof by preventing a shinny spot from being detected as a defect. A surface inspection device comprises a first illumination unit(110), a second illumination unit(120), an image pickup unit(70), an image control unit, and a control unit. The first illumination unit radiates light at a radiation angle(theta1) to a normal line(P) of a line(L) in the moving direction of an inspection object. The second illumination unit radiates light at a radiation angle(theta2) less than the radiation angle of the first illumination unit. The image pick-up unit is mounted to photograph the line. The image control unit displays the line image on a display unit. The control unit controls lighting of the first and second illumination units and handles the image pick-up unit and the image control unit. The light of the second illumination unit only is transmitted to the image pickup unit when there is a shinny spot reflecting the light on the line(L).
申请公布号 KR100763942(B1) 申请公布日期 2007.10.05
申请号 KR20060084812 申请日期 2006.09.04
申请人 POSIS CO., LTD. 发明人 LEE, CHAE HEON;AHN, SANG KYUN
分类号 G01N21/88;G01B11/30 主分类号 G01N21/88
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