A METHOD FOR SKEW COMPENSATION AND AN APPARATUS USING THE METHOD

摘要

A method for skew compensation and a semiconductor memory test apparatus having a skew compensation function are provided to compensate skew of the test apparatus without comprising a compensation apparatus of the test apparatus. According to a method for skew compensation, skew of a sample memory is acquired(S100). A test valid period and the position of a center position of each pin is searched by mounting the sample memory in a test apparatus(S102,S104). The time when the center position in the valid period of each pin becomes is acquired. The skew compensation is performed by applying the skew value of the sample memory when the center position in the valid period becomes. The compensation value obtained by applying the skew value of the sample memory when the center position in the valid period becomes is stored in a storing part of the test apparatus(S106).