ISPECTION DEVICE OF SURFACE FOR FINE ELECTRONIC PARTS,申请号KR20060017757-传众专利搜索

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发明名称	ISPECTION DEVICE OF SURFACE FOR FINE ELECTRONIC PARTS
摘要
申请公布号	KR100763956(B1)	申请公布日期	2007.10.05
申请号	KR20060017757	申请日期	2006.02.23
申请人		发明人
分类号	H01G13/00;G01N21/88;H05K13/08	主分类号	H01G13/00
代理机构		代理人
主权项
地址

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