发明名称 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
摘要 An apparatus for processing plasma and a method for processing the plasma are provided to improve the uniformity inside a surface of a process by voluntarily controlling the spatial distribution of plasma density. An apparatus for processing plasma includes a processing container(10), a first electrode, a second electrode, a processing gas supplying unit, and a first high frequency feeding power unit. The processing container(10) forms a vacuum by being exhausted. The first electrode is attached in a state of electrically floating through an insulator and a space inside the processing container(10). The second electrode supports a substrate to be processed by being opposite to the first electrode. The processing gas supplying unit supplies processing gas to a processing space between the first electrode and a side wall of the second electrode and the processing container(10). The first high frequency feeding power unit applies a first high frequency to the second electrode to generate the plasma of the processing gas on the processing space.
申请公布号 KR20070098587(A) 申请公布日期 2007.10.05
申请号 KR20070030130 申请日期 2007.03.28
申请人 TOKYO ELECTRON LIMITED 发明人 MATSUMOTO NAOKI;HAYAKAWA YOSHINOBU;HANAOKA HIDETOSHI;KODAMA NORIAKI;KOSHIMIZU CHISHIO;IWATA MANABU;TANAKA SATOSHI
分类号 H01L21/3065 主分类号 H01L21/3065
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