发明名称 ELECTRON-BEAM DRAWING DEVICE, ELECTRON-BEAM DRAWING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an electron-beam drawing device that enables to obtain high throughput with simple control, an electron-beam drawing method, and a semiconductor device manufacturing method. <P>SOLUTION: The electron-beam drawing device includes a plurality of micro-emitter electron guns 20 arranged into a half-array shape, a plurality of charge accumulators 10 respectively connected to each of the micro-emitter electron guns, a charge writing circuit capable of writing charges into the charge accumulators, and an electron optical system for emitting electron beams emitted from the micro-emitter electron guns to a body to be processed. The charge writing circuit accumulates charges into the charge accumulators corresponding to an electronic-beam pattern to be drawn. The electronic-beam pattern is emitted to a body to be irradiated by collectively emitting the electronic beams corresponding to a charge amount accumulated in each of the charge accumulators from the micro-emitter electron guns respectively connected to each of the charge accumulators. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007258305(A) 申请公布日期 2007.10.04
申请号 JP20060078189 申请日期 2006.03.22
申请人 TOSHIBA CORP 发明人 KINOSHITA HIDETOSHI
分类号 H01L21/027;G03F7/20;H01J37/305 主分类号 H01L21/027
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