| 摘要 |
A disclosed semiconductor device includes one or more test terminals; a test control circuit configured to receive signals as one or more inputs thereof from the one or more test terminals to test an internal circuit by changing a status of the internal circuit according to the signals; a non-volatile storage unit configured to store specification information used for specifying a connection status of the one or more test terminals; a specification information holding unit configured to hold the specification information; a transfer control unit configured to transfer the specification information from the non-volatile storage unit to the specification information holding unit when power is turned on; and a test terminal status determining unit configured to determine the connection status of the one or more test terminals according to the specification information received from the specification information holding unit. After the test control circuit tests the internal circuit according to the signals received from the one or more test terminals, the specification information held in the specification information holding unit is renewed such that the one or more inputs of the test control circuit are fixed to a predetermined level. |
