发明名称 |
EFFECTIVE DUAL-ENERGY X-RAY ATTENUATION MEASUREMENT |
摘要 |
It is described a method and a CT system for measuring dual-energy X- ray attenuation data of an object. The CT system comprises a rotatable holder, an X-ray source comprising two different X-ray focus points, and an X-ray detection device comprising a plurality of detector elements exhibiting different spectral sensitivities. The method comprises the steps of (a) adjusting the X-ray source such that it emits X-rays originating a first focus point, (b) acquiring first attenuation data separately with first detector elements and with second detector elements, (c) moving the X-ray focus discretely to a second focus point, and (d) acquiring second attenuation data separately with both types of detector elements. Thereby the two focus points are spatially separated from each such that a first beam path originating from the first focus point penetrates a certain voxel within the object and impinges on a first detector element and a second beam path originating from the second X-ray focus point penetrates the same voxel and impinges on a second detector element. |
申请公布号 |
WO2007110795(A2) |
申请公布日期 |
2007.10.04 |
申请号 |
WO2007IB50879 |
申请日期 |
2007.03.14 |
申请人 |
PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;KONINKLIJKE PHILIPS ELECTRONICS N.V.;KOEHLER, THOMAS;SCHLOMKA, JENS-PETER |
发明人 |
KOEHLER, THOMAS;SCHLOMKA, JENS-PETER |
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