发明名称 SAMPLING HOLD CIRCUIT
摘要 <p>The highest frequency of signals that can be sampled by a former-stage sampling hold part is higher than the highest frequency of signals that can be sampled by a latter-stage sampling hold part. The former-stage sampling hold part, therefore, can respond to an input signal at a higher rate. That is, even when the input signal has a high frequency, the former-stage sampling hold part can sample the signal level of the input signal in a precise manner. The latter-stage sampling hold part exhibits a smaller rate of change relative to the time of the sampled signal level than the former-stage sampling hold part, and hence can hold the sampled signal for a longer time than the former-stage sampling hold part.</p>
申请公布号 WO2007110922(A1) 申请公布日期 2007.10.04
申请号 WO2006JP306228 申请日期 2006.03.28
申请人 FUJITSU LIMITED;NAKASHA, YASUHIRO 发明人 NAKASHA, YASUHIRO
分类号 G11C27/02 主分类号 G11C27/02
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