摘要 |
<p>The method involves loading test data by a controller interface for testing an arithmetic and logic unit. The loaded test data is stored in a memory unit of another arithmetic and logic unit. The former arithmetic and logic unit is switched into a test mode, in which a scan-chain of the arithmetic and logic unit is accessible by the latter unit, and the test data is selected by the latter unit. The selected data is moved by the scan chain for providing test result data. The test result data is tested for plausibility by the latter unit for providing a test result for the former unit.</p> |