发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, AND DESIGNING METHOD, DESIGNING DEVICE, OPERATION CONTROL METHOD, AND CONTROL SYSTEM THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a designing method of a semiconductor integrated circuit that can be designed quickly. <P>SOLUTION: The designing method of a semiconductor integrated device includes each stage for determining a variable tolerance for operating temperature and an operating supply voltage when the semiconductor integrated circuit is operated, calculating target temperature and a target supply voltage for canceling variations in circuit characteristics due to variations in the process of the semiconductor integrated circuit for each circuit characteristic according to process variations, assuming that the semiconductor integrated circuit operates within tolerance with the target temperature and target supply voltage nearly as the center, and designing a circuit so that it operates normally at arbitrary temperature and a supply voltage within the tolerance. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2007258569(A) 申请公布日期 2007.10.04
申请号 JP20060083336 申请日期 2006.03.24
申请人 FUJITSU LTD 发明人 OGAWA TOSHIO
分类号 H01L21/82;G06F17/50;H01L21/822;H01L27/04 主分类号 H01L21/82
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