| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device which tests the on/off state of a ODT circuit during a data read mode, and also to provide a test method of the state of the ODT circuit. SOLUTION: The semiconductor memory device is provided with an ODT circuit and an ODT state information output unit. The ODT circuit includes at least one ODT resistor. The ODT state information output unit outputs an ODT state information signal indicating whether the ODT circuit is on/off in response to an ODT control signal during a data read mode when data are output from memory cells. Thus, with the semiconductor memory device and the method for testing whether the ODT resistor is on/off during the data read mode, whether the ODT circuit is on/off during reading of data is tested. COPYRIGHT: (C)2008,JPO&INPIT
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