发明名称 SUBSTRATE PROCESSING APPARATUS AND SIDE WALL COMPONENT
摘要 a substrate processing apparatus that enables abnormal electrical discharges and metal contamination to be prevented from occurring. A processing chamber is configured to house and carry out predetermined plasma processing on a substrate. A lower electrode is disposed on a bottom portion of the processing chamber and has the substrate mounted thereon. An upper electrode is disposed in a ceiling portion of the processing chamber. A side wall component covering a side wall of the processing chamber faces onto a processing space between the upper electrode and the lower electrode. The side wall component has at least one electrode layer to which a DC voltage is applied. An insulating portion made of an insulating material is present at least between the electrode layer and the processing space and covers the electrode layer. The insulating portion is formed by thermally spraying the insulating material.
申请公布号 US2007227663(A1) 申请公布日期 2007.10.04
申请号 US20070691863 申请日期 2007.03.27
申请人 TOKYO ELECTRON LIMITED 发明人 ENDOH SHOSUKE;MORIYA TSUYOSHI;SHIMIZU AKITAKA
分类号 C23F1/00 主分类号 C23F1/00
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