发明名称 AUTOMATIC SHUTDOWN OR THROTTLING OF A BIST STATE MACHINE USING THERMAL FEEDBACK
摘要 A Built-In-Self-Test (BIST) state machine providing BIST testing operations associated with a thermal sensor device(s) located in proximity to the circuit(s) to which BIST testing operations are applied. The thermal sensor device compares the current temperature value sensed to a predetermined temperature threshold and determines whether the predetermined threshold is exceeded. A BIST control element suspends the BIST testing operation in response to meeting or exceeding said predetermined temperature threshold, and initiates resumption of BIST testing operations when the current temperature value normalizes or is reduced. A BIST testing methodology implements steps for mitigating the exceeded temperature threshold condition in response to determining that the predetermined temperature threshold is met or exceeded. These steps include one of: ignoring the BIST results of the suspect circuit(s), or by causing the BIST state machine to enter a wait state and adjusting operating parameters of the suspect circuits while in the wait state.
申请公布号 US2007230260(A1) 申请公布日期 2007.10.04
申请号 US20060278238 申请日期 2006.03.31
申请人 GORMAN KEVIN W;KELLER EMORY D;OUELLETTE MICHAEL R 发明人 GORMAN KEVIN W.;KELLER EMORY D.;OUELLETTE MICHAEL R.
分类号 G11C29/00;G11C7/00 主分类号 G11C29/00
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