| 摘要 |
The present invention is directed to a method for information analysis used to discriminate between biased and unbiased fits. A goodness-of-fit parameter becomes a quantity of interest for analysis of multiple measurements and does so by replacing a likelihood function with a probability of the likelihood function W(L/a). The probability of the likelihood function is derived from a new posterior probability P(a/L) and the goodness-of-fit parameter G, wherein a is a set of fitting parameters, L is the likelihood function and W(L/a) is equal to the product of P(a/L) and G. Furthermore, if substantial prior information is available on a, then the probability of the fitting parameters P(a) can is used to aid in the determination of W(L/a).
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