发明名称 DISPLAY PANEL INSPECTION DEVICE AND DISPLAY PANEL INSPECTION METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a display panel inspection device which relaxes physical restriction from an aspect of a device constitution and accurately measures the position of the foreign matter or flaws on a display panel in the interlaminar unit of the panel, and to provide a display panel inspection method using it. SOLUTION: The display panel inspection device has a stage for supporting a liquid crystal display panel, an illumination light source for irradiating the surface of the liquid crystal display panel that is supported on the stage and an imaging means for imaging the surface of the liquid crystal display panel illuminated by the illumination light source. The illumination light source is constituted, capable of changing the incident angle of the irradiated light into the surface of the liquid crystal display panel. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007256106(A) 申请公布日期 2007.10.04
申请号 JP20060081443 申请日期 2006.03.23
申请人 SHARP CORP 发明人 TAMAKI MAKOTO
分类号 G01N21/95;G01M11/00;G02F1/13;G09F9/00 主分类号 G01N21/95
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