发明名称 ENGINEERED NON-POLYMERIC ORGANIC PARTICLES FOR CHEMICAL MECHANICAL PLANARIZATION
摘要 <p>An abrasive composition comprising composite non-polymeric organic particles that is useful for chemical mechanical planarization (CMP), and which can widely be used in the semiconductor industry. The composite particles individually contain at least one nonpolymeric organic component and at least one other chemical component different from the at least one nonpolymeric organic component. The slurry composition can be vastly simplified if one or more of the components are incorporated into the abrasive particles. The abrasive compositions provide an efficient polishing rate, excellent selectivity and good surface quality when utilized as a new abrasive composition in CMP applications.</p>
申请公布号 EP1838795(A2) 申请公布日期 2007.10.03
申请号 EP20060733607 申请日期 2006.01.05
申请人 DYNEA CHEMICALS OY 发明人 LI, YUZHUO;TANG, KWOK;LI, WU;BIAN, GUOMIN;CHEEMALAPATI, KRISHNAYYA;DUVVURU, VIVEK;BUNDI, DEENESH;BIAN, HENRY
分类号 C09G1/02;C09K3/14;H01L21/321 主分类号 C09G1/02
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