发明名称 X-ray inspection system with coordination between detector and multiple focal spots
摘要 A radiographic inspection system (10) includes an electron gun (20), a fixed anode (22) of a dense material, and apparatus for steering an electron beam (32) generated by the electron gun (20) to multiple focal spots (44) on the anode (22). A detector (14) includes a plurality of individual detector elements (38). Operation of the system is carried out by directing the electron beam (32) at a first time interval to a first focal spot (44) on the anode (22), generating a first X-ray beam (46) aligned with a first detector element (38). During a second time interval, the electron beam (32) is directed to a second focal spot (44) on the anode (22), spaced-away from the first focal spot (44), generating a second X-ray beam (46) aligned with a second detector element (38). This cycle is repeated with additional focal spots (44) in a one-dimensional or two-dimensional pattern. The detector element output is read in coordination with the position of the electron beam (32).
申请公布号 EP1840935(A1) 申请公布日期 2007.10.03
申请号 EP20070104944 申请日期 2007.03.27
申请人 GENERAL ELECTRIC COMPANY 发明人 BIRDWELL, THOMAS WILLIAM;GALISH, ANDREW JOSEPH
分类号 H01J35/30;H05G1/52 主分类号 H01J35/30
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