发明名称 Method for manufacturing SOI wafer
摘要 The present invention provides a manufacturing method for an SOI wafer with a high productivity in which generation of a void is suppressed in manufacturing the SOI wafer. In a manufacturing method for an SOI wafer of the present invention in which two starting wafers are prepared, an insulating layer is formed on at least one of the two starting wafers and the one wafer is adhered to the other wafer without using an adhesive agent, the starting wafers each with no line defect on a surface thereof are used. In a manufacturing method for an SOI wafer of the present invention in which two starting wafers are prepared, an insulating layer is formed on at least one of the two starting wafers and the one wafer is adhered to the other wafer without using an adhesive agent, the starting wafers are subjected to a high temperature heat treatment in advance.
申请公布号 US7276427(B2) 申请公布日期 2007.10.02
申请号 US20050537092 申请日期 2005.06.02
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 ICHIKAWA MASASHI;KOBAYASHI TAKESHI;IWABUCHI MIHO
分类号 H01L21/30;H01L21/02;H01L21/306;H01L21/762;H01L27/12 主分类号 H01L21/30
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