发明名称 Reduction of dopant loss in a gate structure
摘要 A semiconductor device includes offset spacers that contact opposing side surfaces of a gate of a gate structure. The offset spacers can be formed by selectively depositing an oxide layer over the gate and the semiconductor substrate so that the opposing side surfaces of the gate e are substantially free of the oxide layer. Offset spacers can then be formed that contact the opposing side surfaces of the gate.
申请公布号 US7276408(B2) 申请公布日期 2007.10.02
申请号 US20030681399 申请日期 2003.10.08
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHEN YUANNING;VISOKAY MARK
分类号 H01L21/8249;H01L21/28;H01L21/311;H01L21/314;H01L21/316;H01L21/332;H01L21/336 主分类号 H01L21/8249
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