发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor device and a fabricating method thereof are provided to prevent a stacked insulating layer and an applied insulating layer from peeling off. A trench(11) is formed on a surface of a substrate(10), and a stacked insulating layer(121) is formed on a surface of an inner wall of the trench. An applied insulating layer is formed on the stacked insulating layer, and has film density lower than that of the stacked insulating layer. An intermediate insulating is formed between the stacked insulating layer and the applied insulating layer, and has a film density within a range of the film densities of the stacked and applied insulating layers.</p>
申请公布号 KR20070096758(A) 申请公布日期 2007.10.02
申请号 KR20060084012 申请日期 2006.09.01
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IWASAWA KAZUAKI
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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