发明名称 EXPOSURE METHOD, EXPOSURE APPARATUS AND METHOD FOR MANUFACTURING DEVICE
摘要 <p>Exposure conditions are determined according to the moving conditions of a substrate (P) relative to a projection optical system so that a pattern image is projected on the substrate (P) in a desired projection state. A substrate (P) is exposed to light under the thus-determined exposure conditions.</p>
申请公布号 KR20070095272(A) 申请公布日期 2007.09.28
申请号 KR20077005322 申请日期 2007.03.06
申请人 NIKON CORPORATION 发明人 SHIRAISHI KENICHI
分类号 H01L21/027 主分类号 H01L21/027
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