发明名称 ELECTRONIC DEVICE TEST SET AND CONTACT USED THEREIN
摘要 <p>A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested-</p>
申请公布号 SG135138(A1) 申请公布日期 2007.09.28
申请号 SG20070012784 申请日期 2007.02.23
申请人 DENNIS B. SHELL;MATHEW L. GILK;JOSE E. LOPEZ 发明人 SHELL DENNIS B.;GILK MATHEW L.;LOPEZ JOSE E.
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