发明名称 FIN FET AND METHOD FOR FABRICATING THE SAME
摘要 A fin field effect transistor and its manufacturing method are provided to increase the mobility of a carrier by enclosing an active pattern with a stress inducing layer. An active pattern(105) protrudes from a surface of a semiconductor substrate(100), and extends in a first direction, and a first hard mask pattern(120) is formed on the active pattern. An isolation film(140) is formed on the substrate in such a way that a portion of the active pattern protrudes. A stress inducing layer(130) is disposed between the isolation film and the active pattern. A gate structure(165) extends in a second direction to enclose the protruded portion of the active pattern and the first hard mask pattern.
申请公布号 KR20070095062(A) 申请公布日期 2007.09.28
申请号 KR20060025266 申请日期 2006.03.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SUNG MIN;YUN, EUN JUNG;KIM, DONG WON
分类号 H01L21/336 主分类号 H01L21/336
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