发明名称 |
FIN FET AND METHOD FOR FABRICATING THE SAME |
摘要 |
A fin field effect transistor and its manufacturing method are provided to increase the mobility of a carrier by enclosing an active pattern with a stress inducing layer. An active pattern(105) protrudes from a surface of a semiconductor substrate(100), and extends in a first direction, and a first hard mask pattern(120) is formed on the active pattern. An isolation film(140) is formed on the substrate in such a way that a portion of the active pattern protrudes. A stress inducing layer(130) is disposed between the isolation film and the active pattern. A gate structure(165) extends in a second direction to enclose the protruded portion of the active pattern and the first hard mask pattern.
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申请公布号 |
KR20070095062(A) |
申请公布日期 |
2007.09.28 |
申请号 |
KR20060025266 |
申请日期 |
2006.03.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SUNG MIN;YUN, EUN JUNG;KIM, DONG WON |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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