发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To clamp a patterning device without deforming it in a lithographic apparatus. <P>SOLUTION: A first surface of a mask in the lithographic apparatus is clamped using a first clamp device, and a second surface different from the first surface is clamped using a second clamp device. A clamp force is preferably applied using a thin film. The first clamp device clamps a substrate from a direction parallel to a plane of the patterning device, a direction perpendicular to the plane of the patterning device and a rotational direction. The second clamp device clamps the patterning device only in the direction parallel to the substrate plane. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007251137(A) 申请公布日期 2007.09.27
申请号 JP20070027476 申请日期 2007.02.07
申请人 ASML NETHERLANDS BV 发明人 LUTTIKHUIS BERNARDUS ANTONIUS JOHANNES;LOOPSTRA ERIK R;HARMEN KLAAS VAN DER SCHOOT;FRANSICUS MATHIJS JACOBS
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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