发明名称 Calibrating a computed tomography system by using angularly offset foci with fanned-open X-ray beams to irradiate oppositely situated detectors, assigning X-ray beam per angle of rotation of gantry, and coordinating measured values
摘要 <p>Calibrating a computed tomography (CT) system comprises using angularly offset foci with fanned-open X-ray beams to irradiate respectively oppositely situated detectors, assigning each detector element an X-ray beam per angle of rotation of gantry, and coordinating measured values with one another individually per measured X-ray beam. Calibrating a CT system comprises arranging at least two focus/detector systems, arranged angularly offset from one another, on a rotatable gantry; using, to scan an object, the angularly offset foci with fanned-open X-ray beams to irradiate respectively oppositely situated detectors, with a multiplicity of detector elements arranged like matrices, while the focus/detector systems rotate about the object; assigning each detector element, of each focus/detector system, an X-ray beam per angle of rotation of the gantry; and coordinating measured values of the at least two focus/ detector systems, with one another individually per measured X-ray beam, before the carrying out of a reconstruction of CT data of the object from at least two different focus/detector systems by use of a calibration matrix per focus/detector system, each calibration matrix being determined to generate a compensation between measured values during simultaneous operation of the at least two focus/detector systems and absorption data mutually uninfluenced by the number of focus/detector systems. Independent claims are included for: (1) a computed tomography system; and (2) a computer readable medium including program segments for causing the CT tomography system to implement the calibrating method.</p>
申请公布号 DE102005048891(B4) 申请公布日期 2007.09.27
申请号 DE20051048891 申请日期 2005.10.12
申请人 SIEMENS AG 发明人 BRUDER, HERBERT;PETERSILKA, MARTIN
分类号 A61B6/03;H05G1/61 主分类号 A61B6/03
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