| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a fuse latch circuit capable of improving a throughput and yield in a fuse element cutting process by reducing the number of cuttings of real fuse elements, and to provide a semiconductor device including this circuit. <P>SOLUTION: A fuse element section 21 for storing data includes a plurality of fuse elements 21a, and the data are stored in a bit unit in respective fuse elements according to presence/absence of the cutting of fuse element, and these stored data are latched in a bit unit by a latch circuit section 22. In a fuse element section 23 for storing logical information, the logical information about whether the output logic of the data stored in the fuse elements 21a is to be inverted or not, is stored. By a data selecting section 25, any one out of the data latched to the latch circuit section 22 and data obtained by inverting the output logic of the data latched to the latch circuit section 22 by a logic inversion section 24, is selected and output in accordance with the logical information of the fuse element section 23 for storing the logical information. <P>COPYRIGHT: (C)2007,JPO&INPIT |
