发明名称 |
Test Method and Test Device for Testing an Integrated Circuit |
摘要 |
A test method and a test device for testing an integrated circuit are configured to allow for a test device which dispenses with the hardware provision of the boundary scan cells in the device. For this purpose, the boundary scan cells are reproduced by way of a boundary scan program. All functionalities of the chain of boundary scan cells and the TAP interface are fulfilled by the use of the boundary scan program, which is executed by a program-controlled control device that is controlled by the integrated circuit.
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申请公布号 |
US2007226563(A1) |
申请公布日期 |
2007.09.27 |
申请号 |
US20060597139 |
申请日期 |
2006.11.20 |
申请人 |
BUCHNER REINHARD;EBNER CHRISTIAN;MOSEL STEFAN;RAUSCHER PETER;VOIGTLANDER ARNDT |
发明人 |
BUCHNER REINHARD;EBNER CHRISTIAN;MOSEL STEFAN;RAUSCHER PETER;VOIGTLANDER ARNDT |
分类号 |
G01R31/317;G01R31/3185 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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