发明名称 Fixture Characteristic Measuring Device, Method, Program, Recording Medium, Network Analyzer, And Semiconductor Test Device
摘要 There are measured characteristics of a jig (fixture) used to calculate and measure circuit parameters of a device under test. There is provided a jig characteristic measuring device which measures the jig characteristics of a jig 3 which includes signal lines 3 a , 3 b , 3 c, and 3 d used to connect a DUT 2 and a network analyzer 1 with each other (namely, the reflection characteristics of signal lines 3 a , 3 b , 3 c, and 3 d, and the transmission S parameters), measures the reflection coefficients of the signal lines 3 a , 3 b , 3 c, and 3 d in an open state where the DUT 2 is not connected to the signal lines 3 a , 3 b , 3 c, and 3 d, measures the reflection coefficients of the signal lines 3 a , 3 b , 3 c, and 3d in a short-circuit state where all the signal lines 3 a , 3 b , 3 c, and 3 d are grounded, and derives the jig characteristics of the jig 3 based on these measured results.
申请公布号 US2007222455(A1) 申请公布日期 2007.09.27
申请号 US20050568873 申请日期 2005.06.13
申请人 ADVANTEST CORPORATION 发明人 HARUTA MASATO;KONNO HIROYUKI;KIMURA NAOYA;NAKAYAMA YOSHIKAZU
分类号 G01R31/11 主分类号 G01R31/11
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