<p>An apparatus, a method and a system to test a device. An input/output (I/O) block communicates with an external tester to receive test data and to send test result using first and second communication modes. A logic block parses the test data. A memory stores microcode from the parsed test data. The microcode contains a test program to test a circuit. A controller executes the test program.</p>
申请公布号
WO2007109613(A1)
申请公布日期
2007.09.27
申请号
WO2007US64306
申请日期
2007.03.19
申请人
INTEL CORPORATION;GUPTA, SUNIL;LINDE, REED;FACKENTHAL, RICHARD