发明名称 Circuit to reduce internal ESD stress on device having multiple power supply domains
摘要 An ESD protection circuit is designed on an integrated circuit ( 100 ) having a first power supply bus ( 106 ) and a second power supply bus ( 108 ). The circuit includes a first logic gate ( 116, 118 ) having a current path coupled to the first power supply bus. The first logic gate includes an output terminal. A second logic gate ( 122, 124 ) has a current path coupled to the second power supply bus. The second logic gate has an input terminal coupled to the output terminal of the first logic gate. A first device ( 306 ) is coupled in series with the current path of the second logic gate and is always on during normal circuit operation.
申请公布号 US2007223163(A1) 申请公布日期 2007.09.27
申请号 US20070728230 申请日期 2007.03.23
申请人 HUNG CHIH-MING;DUVVURY CHARVAKA 发明人 HUNG CHIH-MING;DUVVURY CHARVAKA
分类号 H02H3/08 主分类号 H02H3/08
代理机构 代理人
主权项
地址