发明名称 |
Circuit to reduce internal ESD stress on device having multiple power supply domains |
摘要 |
An ESD protection circuit is designed on an integrated circuit ( 100 ) having a first power supply bus ( 106 ) and a second power supply bus ( 108 ). The circuit includes a first logic gate ( 116, 118 ) having a current path coupled to the first power supply bus. The first logic gate includes an output terminal. A second logic gate ( 122, 124 ) has a current path coupled to the second power supply bus. The second logic gate has an input terminal coupled to the output terminal of the first logic gate. A first device ( 306 ) is coupled in series with the current path of the second logic gate and is always on during normal circuit operation.
|
申请公布号 |
US2007223163(A1) |
申请公布日期 |
2007.09.27 |
申请号 |
US20070728230 |
申请日期 |
2007.03.23 |
申请人 |
HUNG CHIH-MING;DUVVURY CHARVAKA |
发明人 |
HUNG CHIH-MING;DUVVURY CHARVAKA |
分类号 |
H02H3/08 |
主分类号 |
H02H3/08 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|