发明名称 PACKAGING METHOD OF CHIP OR PACKAGE EQUIPPED WITH BUMPS
摘要 <p>To provide a packaging method that connects a semiconductor chip and a substrate through an under-fill material and after an operation confirmation test is conducted, the under-fill material is heat cured. A packaging method of a semiconductor chip or package equipped with bumps, comprises the steps of arranging a heat-fluidizing and thermosetting under-fill material film between a semiconductor chip or package equipped with bumps and a substrate; applying heat and pressure at a temperature and a pressure sufficiently high to cause fluidization of the under-fill material film and to achieve provisional electrical connection; conducting an operation confirmation test; and if the operation confirmation test proves successful, further heating and curing the under-fill material film to obtain the final electronic device, or if the operation confirmation test proves unsuccessful, removing a defective chip or package at a temperature and a pressure sufficient to cause fluidization of the under-fill material film, and repeating the steps described above by using a new chip or package equipped with bumps.</p>
申请公布号 WO2007109428(A2) 申请公布日期 2007.09.27
申请号 WO2007US63540 申请日期 2007.03.08
申请人 3M INNOVATIVE PROPERTIES COMPANY;KAWATE, KOHICHIRO;KAWATE, YOSHIHISA;LOTTES, ANDREW, C. 发明人 KAWATE, KOHICHIRO;KAWATE, YOSHIHISA;LOTTES, ANDREW, C.
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