发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device in which timing of a signal activating a sense amplifier is optimized and high speed operation can be performed with wide range power source potentials. <P>SOLUTION: The semiconductor memory device is provided with: a memory cell array 11 in which a plurality of static type memory cells constituted of MIS transistors are arranged; a sense amplifier circuit 15 amplifying data transferred to a bit line; a first dummy cell group DCN including a plurality of dummy cells which is constituted of MIS transistors and in which data is fixed; a dummy word line selecting the first dummy cell group DCN; a dummy bit line to which data of the first dummy cell group is transferred; a signal generating circuit 18 generating an activating signal activating the sense amplifier circuit 15; and a potential generating circuit 19 generating a source potential supplied to the first dummy cell group DCN; wherein the source potential is different from a power source potential. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007250020(A) 申请公布日期 2007.09.27
申请号 JP20060067989 申请日期 2006.03.13
申请人 TOSHIBA CORP 发明人 HIRABAYASHI OSAMU
分类号 G11C11/419;G11C11/413 主分类号 G11C11/419
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