| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To measure the number of times when data is normally written/erased concerning a semiconductor memory such as a flash memory or the like. <P>SOLUTION: The number of times for normally writing/erasing the data and the number of times for not normally writing/erasing the data are counted, stored in the memory or the like, and analyzed after a test is completed. Thus, tested semiconductor devices are classified into grades e.g., the devices with high performance capable of conducting writing/erasing by the number of times extremely smaller compared with specified times (i.e., writing/erasing is conducted at high speed) or the devices with normal performance capable of conducting writing-in/erasing by the times substantially close to the specified number of times. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
