发明名称 METHOD FOR PRODUCING SiC SUBSTRATE, SiC SUBSTRATE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce not only micropipes but also basal plane dislocations and stacking faults, in a method for producing an SiC substrate, the SiC substrate and a semiconductor device. SOLUTION: In the method for producing the SiC substrate, an SiC epitaxial growth layer 2 is grown on an SiC single crystal substrate 1 having micropipes by a chemical vapor deposition method. The method includes a process for ion-implanting hydrogen or a rare gas element to the vicinity of the surface of the SiC single crystal substrate 1 or to an intermediate area of the SiC epitaxial growth layer 2 under a condition free of blistering. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007246350(A) 申请公布日期 2007.09.27
申请号 JP20060073596 申请日期 2006.03.16
申请人 MITSUBISHI MATERIALS CORP 发明人 YAMAGUCHI KENJI;MIZUSHIMA KAZUKI
分类号 C30B29/36;C23C14/48;C23C16/42;C30B25/20;H01L21/20;H01L21/205;H01L21/265;H01L29/47;H01L29/872 主分类号 C30B29/36
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