发明名称 |
METHOD FOR PRODUCING SiC SUBSTRATE, SiC SUBSTRATE, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To reduce not only micropipes but also basal plane dislocations and stacking faults, in a method for producing an SiC substrate, the SiC substrate and a semiconductor device. SOLUTION: In the method for producing the SiC substrate, an SiC epitaxial growth layer 2 is grown on an SiC single crystal substrate 1 having micropipes by a chemical vapor deposition method. The method includes a process for ion-implanting hydrogen or a rare gas element to the vicinity of the surface of the SiC single crystal substrate 1 or to an intermediate area of the SiC epitaxial growth layer 2 under a condition free of blistering. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007246350(A) |
申请公布日期 |
2007.09.27 |
申请号 |
JP20060073596 |
申请日期 |
2006.03.16 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
YAMAGUCHI KENJI;MIZUSHIMA KAZUKI |
分类号 |
C30B29/36;C23C14/48;C23C16/42;C30B25/20;H01L21/20;H01L21/205;H01L21/265;H01L29/47;H01L29/872 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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