IC SOCKET AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING APPARATUS

摘要

The number of objects to be tested by parallel testing is increased from that in conventional cases without increasing the sizes of an apparatus nor making a test program complicated. An IC socket for removably mounting a device to be measured on a test board is provided with a test signal generating section, which generates a test signal based on a control instruction from a testing apparatus main body and outputs the signal to the device to be measured.