发明名称 TEST ITEM GENERATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a test item generation device extracting a test item from a branch condition of control of specification information, and generating test item combination information wherein a combination of the extracted test items is optimized. SOLUTION: A guard condition information interpretation part 51 extracts a configuration model element having two or more guard conditions from the specification information 60, and generates guard condition information 52 registered with a guard condition number and the extracted configuration model element. A factor number calculation part 531 calculates a level value and a factor number in each configuration model element of the guard condition information 52, and a factor number total value, and an orthogonal table retrieval part 532 optimizes the combination of the guard conditions of each configuration model element registered in the guard condition information 52 on the basis of the level value of each configuration model element and the level value of a factor of a line dot chart associated to an orthogonal table including the factor number total value stored in an orthogonal table data storage part 55. A combination information output part 57 outputs the optimized combination of the guard conditions as the test item combination information. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007249826(A) 申请公布日期 2007.09.27
申请号 JP20060075187 申请日期 2006.03.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 TOTSUKA YOKO
分类号 G06F11/28 主分类号 G06F11/28
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